Number of the records: 1
Quasistatic capacitance-voltage characteristics of plane-parallel structures: Metal/semi-insulator/metal
- 1.0303745 - URE-Y 20000130 RIV US eng J - Journal Article
Žďánský, Karel
Quasistatic capacitance-voltage characteristics of plane-parallel structures: Metal/semi-insulator/metal.
Journal of Applied Physics. Roč. 88, č. 4 (2000), s. 2024-2029. ISSN 0021-8979. E-ISSN 1089-7550
Grant - others:AV ČR(CZ) KSK1010601 Projekt 7/96/K:4074; EU(XE) PECO 93
Institutional research plan: CEZ:AV0Z2067918
Keywords : semiconductors * insulators * capacitance
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 2.180, year: 2000
Quasistatic capacitance-voltage characteristics of plane-parallel structures of the semi-insulating GaAs with two metal contacts are calculated numerically. Under consideration is the relaxation regime for the charge transport in the semi-insulator. We analyze metal/semi-insulator/metal structures for various parameters of the metal contacts and of the semi-insulator. A more detailed analysis is performed for the following structure: p-type like metal contact/n-type semi-insulator/n-type like metal contact.
Permanent Link: http://hdl.handle.net/11104/0113932
Number of the records: 1