Václavík, P. - Minster, Jiří
Moiré Interferometry with Elliptically Polarized Waves.
Optical Engineering. Roč. 38, č. 4 (1999), s. 630-635. ISSN 0091-3286. E-ISSN 1560-2303
R&D Projects: GA ČR GA101/97/0730
Impact factor: 1.171, year: 1999
http://hdl.handle.net/11104/0105632