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The use of an optically trapped microprobe for scanning details of surface
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SYSNO ASEP 0205715 Document Type C - Proceedings Paper (int. conf.) R&D Document Type Conference Paper Title The use of an optically trapped microprobe for scanning details of surface Author(s) Šerý, Mojmír (UPT-D) RID, SAI
Jákl, Petr (UPT-D) RID, ORCID, SAI
Ježek, Jan (UPT-D) RID, ORCID, SAI
Jonáš, Alexandr (UPT-D) RID, SAI, ORCID
Zemánek, Pavel (UPT-D) RID, SAI, ORCID
Liška, M. (CZ)Source Title Proceedings of the 13th Polish-Czech-Slovak Optical Conference on Wave and Quantum Aspects of Contemporary Optics (Proc. SPIE 5259). - Washington : SPIEThe International Society for Optical Engineering, 2003 Pages s. 166 - 169 Number of pages 4 s. Action SPIE: Wave and Quantum Aspects of Contemporary Optics Event date 09.09.2002-13.09.2002 VEvent location Krzyzowa Country PL - Poland Event type WRD Language eng - English Country PL - Poland Keywords optical tweezers ; two-photon fluorescence ; surface profiling Subject RIV BH - Optics, Masers, Lasers R&D Projects GA101/00/0974 GA ČR - Czech Science Foundation (CSF) CEZ AV0Z2065902 - UPT-D Annotation We present two methods for surface profiles measurement using optically trapped probe in tightly focused laser beam (optical tweezers). The first method is based on a continuous contact of the probe with the surface (contact mode) and the second one employes the alternating contact (tapping mode). The probe deviations are detected by two-photon fluorescence excited by the trapping beam and emitted by the trapped dyed probe. Workplace Institute of Scientific Instruments Contact Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178 Year of Publishing 2004
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