Measurements of Residual Reflectivity and Wavelength of Coated Laser Diodes

0205391 - UPT-D 20010031 RIV CZ eng C - Conference Paper (international conference)
Růžička, Bohdan - Lazar, Josef - Wilfert, O.
Measurements of Residual Reflectivity and Wavelength of Coated Laser Diodes.
11th International Czech - Slovak Scientific Conference Radioelektronika 2001 Conference Proceedings. Brno: Brno University of Technology, 2001, s. 286-289. ISBN 80-214-1861-3.
[Radioelektronika 2001 /11./. Brno (CZ), 10.05.2001-11.05.2001]
R&D Projects: GA ČR GA101/98/P270; GA AV ČR IAA2065803
Institutional research plan: CEZ:AV0Z2065902
Keywords : electron beam vacuum evaporation technique
Subject RIV: BH - Optics, Masers, Lasers

This contribution presents experimental results obtained by deposition of double-layer system made by means of electron-beam vacuum evaporation technique. We oriented our effort to short-wavelength 633 - 635 nm laser diodes. These devices are emitting close to the wavelength of traditional He-Ne lasers with an intention to use them in extended-cavity laser design for metrological purposes. The resulting reflectivities were evaluated by measuring a testing plate of GaAs and by measuring a "modulation depth" of a coated diode emission spectra. Our best results were reflectivities well below 10 -4 and the repeatibility of the deposition process in a range not exceeding 2x10 -4 .
Permanent Link: http://hdl.handle.net/11104/0101005