Noncharging scanning electron microscopy of non-conductors at automatically adjusted critical energies

Number of the records: 1

SYSNO	0204994
Title	Noncharging scanning electron microscopy of non-conductors at automatically adjusted critical energies
Author(s)	Zadražil, Martin (UPT-D) Frank, Luděk (UPT-D)_{RID, SAI, ORCID} Müllerová, Ilona (UPT-D)_{RID, SAI, ORCID}
Source Title	Proceedings of the 14th International Congress on Electron Microscopy. s. 457-458, General Interest and Instrumentation. / Benavides H. A. C. ; Yacamán M. J.. - Bristol : Institute of Physics Publishing Ltd., 1998
Conference	ICEM /14./ - International Congress on Electron Microscopy, Cancun, 31.08.1998-04.09.1998
Document Type	Konferenční příspěvek (zahraniční konf.)
Grant	GA202/96/0961 GA ČR - Czech Science Foundation (CSF)
Language	eng
Country	MX
Permanent Link	http://hdl.handle.net/11104/0100614

Number of the records: 1