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Characterization of III-V Semiconductor Heterostructure on Bevelled Surface
- 1.0204950 - UPT-D 970084 SK eng A - Abstract
Srnánek, R. - Kováč, J. - Fesic, V. - Frank, Luděk - Liday, J. - Vogrincic, P. - Novotný, I. - Hotový, I. - Buc, D.
Characterization of III-V Semiconductor Heterostructure on Bevelled Surface.
3rd International Workshop on Heterostructure Epitaxy and Devices HEAD '97. Bratislava: Institute of Electrical Engineering, Slovak Academy of Sciences, 1997. s. P10.
[HEAD '97 /3./. 12.10.1997-16.10.1997, Smolenice]
Permanent Link: http://hdl.handle.net/11104/0100570
Number of the records: 1