0195260 - UE-C 960029 RIV CZ eng J - Journal Article
Novák, Vít - Hirschinger, J. - Eberle, W. - Wimmer, Ch. - Prettl, W.
Simplified 2-D model of current filamentation in low temperature breakdown regime of semiconductors.
Acta Technica CSAV. Roč. 41, č. 5 (1996), s. 553-567. ISSN 0001-7043
R&D Projects: GA ČR GA202/96/0254
Permanent Link: http://hdl.handle.net/11104/0090926