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The Noise Reduction of Silicon Detectors by Wafer Analyses and Technological Procedures
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SYSNO 0192659 Title The Noise Reduction of Silicon Detectors by Wafer Analyses and Technological Procedures Author(s) Tykva, Richard (UOCHB-X)
Kopešťanský, Josef (UOCHB-X)Source Title Nuclear Instruments & Methods in Physics Research Section A. Roč. 380, - (1996), s. 198-200. - : Elsevier Document Type Článek v odborném periodiku Grant GA206/93/0333 GA ČR - Czech Science Foundation (CSF) GA206/93/1098 GA ČR - Czech Science Foundation (CSF) Language eng Country NL Permanent Link http://hdl.handle.net/11104/0088384
Number of the records: 1