Number of the records: 1  

The Noise Reduction of Silicon Detectors by Wafer Analyses and Technological Procedures

    1.
    SYSNO ASEP0192659
    Document TypeJ - Journal Article
    R&D Document TypeJournal Article
    Subsidiary JOstatní články
    TitleThe Noise Reduction of Silicon Detectors by Wafer Analyses and Technological Procedures
    Author(s) Tykva, Richard (UOCHB-X)
    Kopešťanský, Josef (UOCHB-X)
    Source TitleNuclear Instruments & Methods in Physics Research Section A. - : Elsevier - ISSN 0168-9002
    Roč. 380, - (1996), s. 198-200
    Languageeng - English
    CountryNL - Netherlands
    R&D ProjectsGA206/93/0333 GA ČR - Czech Science Foundation (CSF)
    GA206/93/1098 GA ČR - Czech Science Foundation (CSF)
    WorkplaceInstitute of Organic Chemistry and Biochemistry
    Contactasep@uochb.cas.cz ; Kateřina Šperková, Tel.: 232 002 584 ; Jana Procházková, Tel.: 220 183 418
    Year of Publishing1998

Number of the records: 1  

  This site uses cookies to make them easier to browse. Learn more about how we use cookies.

Accept allSettingsReject all