Number of the records: 1  

Characterization of polymeric films by ellipsometry

    1.
    SYSNO ASEP0185043
    Document TypeJ - Journal Article
    R&D Document TypeJournal Article
    Subsidiary JOstatní články
    TitleCharacterization of polymeric films by ellipsometry
    Author(s) Švorčík, V. (CZ)
    Tichá, H. (CZ)
    Rybka, V. (CZ)
    Hnatowicz, Vladimír (UJF-V) RID
    Source TitleJournal of Materials Science Letters - ISSN 0261-8028
    Roč. 19, - (2000), s. 679-681
    Number of pages3 s.
    Languageeng - English
    CountryDE - Germany
    Subject RIVBG - Nuclear, Atomic and Molecular Physics, Colliders
    CEZAV0Z1048901 - UJF-V
    AnnotationThe reflection and transmission ellipsometry is used for characterization of poly(ethyleneterephtalate), polyethylene andpolystyrene thin films. The dependence of ellipsometric parameters .psí. and .DELTA. on the polarity, orientation and thickness of the film is determined. From the reflection measurement data the relative permittivity and refractive index ofpolymers is determined.
    WorkplaceNuclear Physics Institute
    ContactMarkéta Sommerová, sommerova@ujf.cas.cz, Tel.: 266 173 228
    Year of Publishing2001

Number of the records: 1  

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