Number of the records: 1
Surface Modification Study of Bi.sub.2./sub.Se.sub.3./sub., and the Substitutional Bi.sub.1.6./sub.Sb.sub.0.4./sub.Se.sub.3./sub. and Bi.sub.1.9./sub.Sb.sub.0.1./sub.Se.sub.3./sub. by STM and AFM in Air
- 1.0180865 - UFCH-W 20000052 RIV JP eng C - Conference Paper (international conference)
Contera, S. A. - Yoshinobu, T. - Iwasaki, H. - Bastl, Zdeněk
Surface Modification Study of Bi2Se3, and the Substitutional Bi1.6Sb0.4Se3 and Bi1.9Sb0.1Se3 by STM and AFM in Air.
Proceedings on Advanced Nanoelectronics: Devices, Materials, and Computing. Vol. 57. Sanken: Osaka University, 2000, s. 218-219.
[Sanken International Symposium /3./. Sanken (JP), 14.03.2000-15.03.2000]
Institutional research plan: CEZ:AV0Z4040901; CEZ:A54/98:Z4-040-9-ii
Subject RIV: CF - Physical ; Theoretical Chemistry
The atom force microscope (AFM) and scanning tunneling microscope (STM) were used for localised modifications of surfaces of Bi2Se3, Bi1.6Sb0.4Se3 and Bi1.9Sb0.1Se3 layered crystals consisting in the elevation of selected portions
Permanent Link: http://hdl.handle.net/11104/0077487
Number of the records: 1