0173900 - MU-W 930148 RIV GB eng J - Journal Article
Saxl, Ivan
Contact distances and random free paths.
Journal of Microscopy. Roč. 170, č. 1 (1993), s. 53-64. ISSN 0022-2720. E-ISSN 1365-2818
Permanent Link: http://hdl.handle.net/11104/0070922