0161405 - SLCHPL-S 20000030 RIV CZ eng C - Conference Paper (international conference)
Nagels, P. - Mertens, R. - Tichý, Ladislav
Structural characterization of amorphous GexSe100-x by infrared and Raman Spectroscopy.
Properties and Application of Amorphous Materials. Pardubice: SLCHPL AV ČR a UPa, 2000, s. 12.
[Nato Advanced Study Institute Properties and Applications of Amorphous Materials. Seč (CZ), 25.06.2000-07.07.2000]
Institutional research plan: CEZ:AV0Z4050913
Subject RIV: CA - Inorganic Chemistry

Using Raman spectroscopy the high degree of order in PECVD Ge-Sefilms was found.
Permanent Link: http://hdl.handle.net/11104/0058758