Stability of the inelastic mean free paths determined by elastic peak electron spectroscopy in nickel and silicon

Name: Stability of the inelastic mean free paths determined by elastic peak electron spectroscopy in nickel and silicon
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Jiříček, Petr; Zemek, Josef; Lejček, Pavel; Lesiak, B.; Jablonski, A.; Čerňanský, Marian

Number of the records: 1

Stability of the inelastic mean free paths determined by elastic peak electron spectroscopy in nickel and silicon

1.

SYSNO	0134659
Title	Stability of the inelastic mean free paths determined by elastic peak electron spectroscopy in nickel and silicon
Author(s)	Jiříček, Petr (FZU-D)_{RID, ORCID, SAI} Zemek, Josef (FZU-D)_{RID, ORCID} Lejček, Pavel (FZU-D)_{RID, ORCID, SAI} Lesiak, B. (PL) Jablonski, A. (PL) Čerňanský, Marian (FZU-D)_RID
Source Title	Journal of Vacuum Science & Technology A : Vacuum, Surfaces and Films. Roč. 20, č. 2 (2002), s. 447-455. - : AIP Publishing
Document Type	Článek v odborném periodiku
Grant	GA202/02/0237 GA ČR - Czech Science Foundation (CSF)
CEZ	AV0Z1010914 - FZU-D
Language	eng
Country	US
Keywords	Monte Carlo simulation * electron-solid interaction * inelastic mean free path(IMFP) * elastic peak electron spectroscopy(EPES)
Permanent Link	http://hdl.handle.net/11104/0032553

Number of the records: 1