Number of the records: 1
Stability of the inelastic mean free paths determined by elastic peak electron spectroscopy in nickel and silicon
- 1.
SYSNO ASEP 0134659 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Ostatní články Title Stability of the inelastic mean free paths determined by elastic peak electron spectroscopy in nickel and silicon Author(s) Jiříček, Petr (FZU-D) RID, ORCID, SAI
Zemek, Josef (FZU-D) RID, ORCID
Lejček, Pavel (FZU-D) RID, ORCID, SAI
Lesiak, B. (PL)
Jablonski, A. (PL)
Čerňanský, Marian (FZU-D) RIDSource Title Journal of Vacuum Science & Technology A : Vacuum, Surfaces and Films. - : AIP Publishing - ISSN 0734-2101
Roč. 20, č. 2 (2002), s. 447-455Number of pages 9 s. Language eng - English Country US - United States Keywords Monte Carlo simulation ; electron-solid interaction ; inelastic mean free path(IMFP) ; elastic peak electron spectroscopy(EPES) Subject RIV BM - Solid Matter Physics ; Magnetism R&D Projects GA202/02/0237 GA ČR - Czech Science Foundation (CSF) CEZ AV0Z1010914 - FZU-D Annotation The scatter between the measured IMFPs obtained in the present work and predictive formulas IMFP values is determined. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2004
Number of the records: 1