Jiříček, Petr - Zemek, Josef - Lejček, Pavel - Lesiak, B. - Jablonski, A. - Čerňanský, Marian
Stability of the inelastic mean free paths determined by elastic peak electron spectroscopy in nickel and silicon.
Journal of Vacuum Science & Technology A : Vacuum, Surfaces and Films. Roč. 20, č. 2 (2002), s. 447-455. ISSN 0734-2101. E-ISSN 1520-8559
R&D Projects: GA ČR GA202/02/0237
Impact factor: 1.301, year: 2002
http://hdl.handle.net/11104/0032553