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Stability of the inelastic mean free paths determined by elastic peak electron spectroscopy in nickel and silicon

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    JIŘÍČEK, Petr, ZEMEK, Josef, LEJČEK, Pavel, LESIAK, B., JABLONSKI, A., ČERŇANSKÝ, Marian. Stability of the inelastic mean free paths determined by elastic peak electron spectroscopy in nickel and silicon. Journal of Vacuum Science & Technology A : Vacuum, Surfaces and Films. 2002, 20(2), 447-455. ISSN 0734-2101. E-ISSN 1520-8559.

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