0134647 - FZU-D 20030547 RIV CZ eng J - Journal Article
Romanyuk, Olexandr - Jiříček, Petr - Cukr, Miroslav - Bartoš, Igor
GaAs(100)-(1X1) structure analysis from LEED intensities.
Czechoslovak Journal of Physics. Roč. 53, č. 1 (2003), s. 49-54. ISSN 0011-4626.
[Symposium on Surface Physics /9./. Třešť, 02.09.2002-06.09.2002]
R&D Projects: GA AV ČR IAA1010108
Institutional research plan: CEZ:AV0Z1010914
Keywords : LEED I-V analysis * GaAs(100)-(1X1) * MBE * TLEED * surface relaxation
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 0.263, year: 2003

GaAs(100)-(1X1) surface grown by molecular-beam epitaxy was studied by low energy electron diffraction (LEED).

Permanent Link: http://hdl.handle.net/11104/0000694