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Scribing into hydrogenated diamond surfaces using atomic force microscopy
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SYSNO ASEP 0134410 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Ostatní články Title Scribing into hydrogenated diamond surfaces using atomic force microscopy Author(s) Rezek, Bohuslav (FZU-D) RID, ORCID
Saurer, C. (DE)
Garrido, J. A. (DE)
Nebel, C. E. (DE)
Stutzmann, M. (DE)
Snidero, E. (FR)
Bergonzo, P. (FR)Source Title Applied Physics Letters. - : AIP Publishing - ISSN 0003-6951
Roč. 82, č. 19 (2003), s. 3336-3338Number of pages 3 s. Language eng - English Country US - United States Keywords atomic force microscopy(AFM) ; surface termination of hydrogenated diamond ; microscopic patterns Subject RIV BM - Solid Matter Physics ; Magnetism CEZ AV0Z1010914 - FZU-D Annotation Using negatively biased silicon cantilevers, microscopic patterns can be scribed into a diamond surface, up to depth of 3 nm. The inscribed patterns exhibit different electronic properties to the rest of surface, namely electron affinity and conductivity. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2004
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