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Polarized x-ray absorption spectra of CuGeO.sub.3./sub. at the Cu and Ge K edges

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    0134315 - FZU-D 20030211 RIV US eng J - Journal Article
    Šipr, Ondřej - Šimůnek, Antonín - Bocharov, S. - Dräger, G.
    Polarized x-ray absorption spectra of CuGeO3 at the Cu and Ge K edges.
    Physical Review. B. Roč. 66, č. 15 (2002), s. 155119-1 - 155119-8. ISSN 0163-1829
    R&D Projects: GA ČR GA202/02/0841; GA ČR GA203/02/0436
    Institutional research plan: CEZ:AV0Z1010914
    Keywords : XANES * multiple scattering
    Subject RIV: BM - Solid Matter Physics ; Magnetism
    Impact factor: 3.327, year: 2002

    Polarized x-ray absorption near edge structure spectra at both the Cu and Ge K edges of CuGeO3 are measured and calculated relying on the real-space multiple-scattering formalism within a one-electron approach. The polarization components are resolved not only in the unit cell coordinate system but also in a local frame attached to the nearest neighborhood of the photoabsorbing Cu atom. In that way, features which resist a particular theoretical description can be identified.
    Permanent Link: http://hdl.handle.net/11104/0032223

     
     

Number of the records: 1  

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