0134048 - FZU-D 20020336 RIV NL eng J - Journal Article
Rezek, Bohuslav - Mates, Tomáš - Šípek, Emil - Stuchlík, Jiří - Fejfar, Antonín - Kočka, Jan
Influence of combined AFM/current measurement on local electronic properties of silicon thin films.
Journal of Non-Crystalline Solids. 299-302, - (2002), s. 360-364. ISSN 0022-3093. E-ISSN 1873-4812
Institutional research plan: CEZ:AV0Z1010914
Keywords : silicon thin films * electronic properties * combined AFM/current measurement
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 1.435, year: 2002

Combined AFM/current measurement leads to a modification of local electronic properties detected as a significant decrease in local current.
Permanent Link: http://hdl.handle.net/11104/0031989