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Multiply charged ion-induced secondary electron emission from metals relevent for laser source beam diagnostics
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SYSNO 0133992 Title Multiply charged ion-induced secondary electron emission from metals relevent for laser source beam diagnostics Author(s) Láska, Leoš (FZU-D)
Krása, Josef (FZU-D) RID, ORCID
Stöckli, M. P. (US)
Fehrenbach, C. W. (US)Source Title Review of Scientific Instruments. Roč. 73, č. 2 (2002), s. 776-778. - : AIP Publishing Document Type Článek v odborném periodiku Grant IAA1010819 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) IAA1010105 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) LN00A100 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) CEZ AV0Z1010921 - FZU-D Language eng Country US Keywords ion-induced secondary electron emission * laser ion source beam diagnostics Permanent Link http://hdl.handle.net/11104/0031938
Number of the records: 1