Láska, Leoš - Krása, Josef - Stöckli, M. P. - Fehrenbach, C. W.
Multiply charged ion-induced secondary electron emission from metals relevent for laser source beam diagnostics.
Review of Scientific Instruments. Roč. 73, č. 2 (2002), s. 776-778. ISSN 0034-6748. E-ISSN 1089-7623
Grant CEP: GA AV ČR IAA1010819; GA AV ČR IAA1010105; GA MŠMT LN00A100
Impakt faktor: 1.437, rok: 2002
http://hdl.handle.net/11104/0031938