0133977 - FZU-D 20020265 RIV NL eng J - Článek v odborném periodiku
Krása, Josef - Láska, Leoš - Stöckli, M. P. - Fehrenbach, C. W.
Electron yield from Be-Cu induced by highly charged Xe q+ ions.
Nuclear Instruments & Methods in Physics Research Section B. Roč. 196, - (2002), s. 61-67. ISSN 0168-583X. E-ISSN 1872-9584
Grant CEP: GA AV ČR IAA1010105; GA MŠMT LN00A100
Výzkumný záměr: CEZ:AV0Z1010921
Klíčová slova: highly charged ion-induced electron emission * angle impact effect * Be-Cu
Kód oboru RIV: BH - Optika, masery a lasery
Impakt faktor: 1.158, rok: 2002

The total electron yield, gamma, for emission of electrons induced by impact of Xe^q+ (8óqó28) ions with kinetic energy per charge E_i/q from 5 to 150keV/q on clean Be-Cu is presented for the impact angle, é, ranging from 0^o to 60^o.The é-dependences are analyzed with the use of the relation, which can distinguish above- and below-surface electron emission.
Trvalý link: http://hdl.handle.net/11104/0031924