0133868 - FZU-D 20020047 RIV GB eng J - Journal Article
Glinchuk, M. D. - Eliseev, E. A. - Deineka, Alexander - Jastrabík, Lubomír - Suchaneck, G. - Sandner, T. - Gerlach, G. - Hrabovský, Miroslav
Optical refraction index and polarization profile of ferroelectric thin films.
Integrated Ferroelectrics. Roč. 38, 1-4 (2001), s. 101-110. ISSN 1058-4587. E-ISSN 1607-8489
R&D Projects: GA MŠMT LN00A015; GA ČR GA202/00/1425
Institutional research plan: CEZ:AV0Z1010914
Keywords : thin film * refraction index * polarization * film thickness
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 0.512, year: 2001

Analytical calculations of polarization and optical refraction index in ferroelectric thin films are performed in the framework of thermodynamic theory. The thickness dependence of the optical refraction index was found to be proportional to squared polarization.
Permanent Link: http://hdl.handle.net/11104/0031819