Srnanek, R. - Gurnik, P. - Harmatha, L. - Gregora, Ivan
Diagnostics of Si multi-delta-doped GaAs layers by Raman spectroscopy on bevelled structures.
Applied Surface Science. Roč. 183, - (2002), s. 86-92. ISSN 0169-4332. E-ISSN 1873-5584
Grant - others:VEGA(SK) 1/7600/20; VEGA(SK) 1/6098/99; VEGA(SK) 1/7613/20
Impact factor: 1.295, year: 2002
http://hdl.handle.net/11104/0000631