Number of the records: 1
Diagnostics of Si multi-delta-doped GaAs layers by Raman spectroscopy on bevelled structures
- 1.Srnanek, R., Gurnik, P., Harmatha, L., Gregora, I. Diagnostics of Si multi-delta-doped GaAs layers by Raman spectroscopy on bevelled structures. Applied Surface Science. 2002, 183(-), 86-92. ISSN 0169-4332. E-ISSN 1873-5584.
Number of the records: 1