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Fourier transform infrared photocurrent spectroscopy in microcrystralline silicon

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    0133739 - FZU-D 20020120 RIV NL eng J - Journal Article
    Poruba, Aleš - Vaněček, Milan - Meier, J. - Shah, A.
    Fourier transform infrared photocurrent spectroscopy in microcrystralline silicon.
    Journal of Non-Crystalline Solids. 299-302, - (2002), s. 536-540. ISSN 0022-3093. E-ISSN 1873-4812
    EU Projects: European Commission(XE) ENK6-CT-2000-00321 - DOIT
    Institutional research plan: CEZ:AV0Z1010914
    Keywords : microcrystalline silicon * photocurrent spectroscopy * optical absorption
    Subject RIV: BM - Solid Matter Physics ; Magnetism
    Impact factor: 1.435, year: 2002

    A fast and sensitive method for measurement of spectral dependence of the optical absorption coefficint ŕ(E) in thin films of photosensitive materials is introduced.
    Permanent Link: http://hdl.handle.net/11104/0031700


     
     

Number of the records: 1  

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