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Ellipsometric investigations of the refractive index depth profile in PZT thin films

    1.
    SYSNO0133592
    TitleEllipsometric investigations of the refractive index depth profile in PZT thin films
    Author(s) Deineka, Alexander (FZU-D)
    Jastrabík, Lubomír (FZU-D) RID, ORCID
    Suchaneck, G. (DE)
    Gerlach, G. (DE)
    Source Title Physica Status Solidi A : Applied Research. Roč. 188, č. 4 (2001), s. 1549-1552
    Document TypeČlánek v odborném periodiku
    Grant LN00A015 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    GA202/00/1425 GA ČR - Czech Science Foundation (CSF)
    CEZAV0Z1010914 - FZU-D
    Languageeng
    CountryDE
    Keywords PZT films * optical investigations
    Permanent Linkhttp://hdl.handle.net/11104/0031555
     

Number of the records: 1  

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