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Ellipsometric investigations of the refractive index depth profile in PZT thin films
- 1.DEINEKA, A., JASTRABÍK, L., SUCHANECK, G., GERLACH, G. Ellipsometric investigations of the refractive index depth profile in PZT thin films. Physica Status Solidi A. 2001, 188(4), 1549-1552. ISSN 0031-8965.
Number of the records: 1