Number of the records: 1
Electron probe microanalysis of nonconductive bulk samples
- 1.
SYSNO ASEP 0133467 Document Type C - Proceedings Paper (int. conf.) R&D Document Type Conference Paper Title Electron probe microanalysis of nonconductive bulk samples Author(s) Jurek, Karel (FZU-D) RID, ORCID, SAI
Gedeon, O. (CZ)Source Title Electron probe microanalysis today practical aspects / Starý V. ; Mašek K. ; Horák K.. - Praha : Czech Technical University in Prague, Faculty of Mechanical Engineering, 2000 - ISBN 80-01-02176-9 Pages s. 83-88 Number of pages 6 s. Action EMAS /4./ Event date 17.05.2000-20.05.2000 VEvent location Třešť Country CZ - Czech Republic Event type EUR Language eng - English Country CZ - Czech Republic Keywords electron probe ; x-ray microanalysis ; electric charging Subject RIV BM - Solid Matter Physics ; Magnetism CEZ AV0Z1010914 - FZU-D Annotation Electron probe x-ray microanalysis of nonconductiv samples can be distorted b electrical field formation under the grounded surface. This posibility is demonstarted by Monte carlo modeling. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2002
Number of the records: 1