0133467 - FZU-D 20010319 RIV CZ eng C - Conference Paper (international conference)
Jurek, Karel - Gedeon, O.
Electron probe microanalysis of nonconductive bulk samples.
Electron probe microanalysis today practical aspects. Praha: Czech Technical University in Prague, Faculty of Mechanical Engineering, 2000 - (Starý, V.; Mašek, K.; Horák, K.), s. 83-88. ISBN 80-01-02176-9.
[EMAS /4./. Třešť (CZ), 17.05.2000-20.05.2000]
Institutional research plan: CEZ:AV0Z1010914
Keywords : electron probe * x-ray microanalysis * electric charging
Subject RIV: BM - Solid Matter Physics ; Magnetism

Electron probe x-ray microanalysis of nonconductiv samples can be distorted b electrical field formation under the grounded surface. This posibility is demonstarted by Monte carlo modeling.
Permanent Link: http://hdl.handle.net/11104/0031432