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Ellipsometry non-destructive technique for PZT thin films investigations
- 1.DEINEKA, A., JASTRABÍK, L., SOUKUP, L. Ellipsometry non-destructive technique for PZT thin films investigations. Jemná mechanika a optika. 2000, 11-12(-), 329-331. ISSN 0447-6441.
Number of the records: 1