0133204 - FZU-D 20000495 RIV US eng C - Conference Paper (international conference)
Kálal, M. - Rus, Bedřich - Mocek, Tomáš - Skála, Jiří - Králiková, Božena - Zeitoun, P. - Sebban, S.
Electron density profile measurements of line plasmas by interferometry technique.
08194-2151-0. In: Fourth International Workshop on Iodine Lasers and Applications. Proceedings. Washington: SPIE (International Sopciety for Optical Engineering), 1996 - (Rohlena, K.; Kodymová, J.; Králiková, B.), s. 119-124. SPIE Proceedings Series., 2767.
[International Workshop on Iodine Lasers and Applications /4./. Třešť (CZ), 18.09.1995-22.09.1995]
Subject RIV: BH - Optics, Masers, Lasers
Permanent Link: http://hdl.handle.net/11104/0031186