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Restortion and processing of physical profiles from measured data
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SYSNO 0133126 Title Restortion and processing of physical profiles from measured data Author(s) Čerňanský, Marian (FZU-D) RID Source Title Defect and Microstructure Analysis by Diffraction. s. 613-646 / Snyder R.L. ; Fiala J. ; Bunge H.J.. - New York : Int. Union of Crystallography, Oxford University Press, 1999 Conference Saiz strain "95"-X-Ray Powder Diffusion Analysis of Real Structure of Mater International Conference, Liptovský Mikuláš, 21.08.1995-25.08.1995 Document Type Konferenční příspěvek (zahraniční konf.) Grant GA202/96/1685 GA ČR - Czech Science Foundation (CSF) Language eng Country US Permanent Link http://hdl.handle.net/11104/0031113
Number of the records: 1