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Restortion and processing of physical profiles from measured data
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SYSNO ASEP 0133126 Document Type C - Proceedings Paper (int. conf.) R&D Document Type Conference Paper Title Restortion and processing of physical profiles from measured data Author(s) Čerňanský, Marian (FZU-D) RID Source Title Defect and Microstructure Analysis by Diffraction / Snyder R.L. ; Fiala J. ; Bunge H.J.. - New York : Int. Union of Crystallography, Oxford University Press, 1999 - ISBN 019-850-1897 Pages s. 613-646 Number of pages 33 s. Action Saiz strain "95"-X-Ray Powder Diffusion Analysis of Real Structure of Mater International Conference Event date 21.08.1995-25.08.1995 VEvent location Liptovský Mikuláš Country SR - Surinam Language eng - English Country US - United States Subject RIV BM - Solid Matter Physics ; Magnetism R&D Projects GA202/96/1685 GA ČR - Czech Science Foundation (CSF) Annotation State of the art evolution techniques for restorting (deconvolution of) physical patterns from the measured diffraction profiles, background subtraction, smoothing and interpolation, Fourier techniques, iterative solutions of integral equations, inverse filtering, regularisation and maximum entropy methods, maximum likelihood and Bayesian methods are discussed in detail. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2001
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