Čerňanský, Marian
Restortion and processing of physical profiles from measured data.
Defect and Microstructure Analysis by Diffraction. New York: Int. Union of Crystallography, Oxford University Press, 1999 - (Snyder, R.; Fiala, J.; Bunge, H.), s. 613-646. ISBN 019-850-1897.
[Saiz strain "95"-X-Ray Powder Diffusion Analysis of Real Structure of Mater International Conference. Liptovský Mikuláš (SR), 21.08.1995-25.08.1995]
R&D Projects: GA ČR GA202/96/1685
http://hdl.handle.net/11104/0031113