Dielectric response of ferroelectric liquid crystal thin layer

Number of the records: 1

SYSNO ASEP	0133059
Document Type	J - Journal Article
R&D Document Type	Journal Article
Subsidiary J	Ostatní články
Title	Dielectric response of ferroelectric liquid crystal thin layer
Author(s)	Rychetský, Ivan (FZU-D)_{RID, ORCID} Novotná, Vladimíra (FZU-D)_{RID, ORCID, SAI} Glogarová, Milada (FZU-D)_{RID, ORCID}
Source Title	Journal de Physique IV - ISSN 1155-4339 Roč. 10, - (2000), s. 119-122
Number of pages	4 s.
Language	eng - English
Country	FR - France
Subject RIV	BM - Solid Matter Physics ; Magnetism
R&D Projects	GA202/00/1187 GA ČR - Czech Science Foundation (CSF)
	GA202/99/1120 GA ČR - Czech Science Foundation (CSF)
	KSK1010601 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
CEZ	AV0Z1010914 - FZU-D
Annotation	In the thin layer of the SmC* phase the unwound twisted structure or the helical structure with the dechiralization lines can appear depending on the layer thickness and the sample processing. The thickness dependent dielectric response of both structures is calculated and compared.
Workplace	Institute of Physics
Contact	Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
Year of Publishing	2001

Number of the records: 1