Number of the records: 1  

Local electronic transport in microrystalline silicon observed by combined atomic force microscopy

  1. 1.
    SYSNO0132973
    TitleLocal electronic transport in microrystalline silicon observed by combined atomic force microscopy
    Author(s) Fejfar, Antonín (FZU-D) RID, ORCID, SAI
    Rezek, Bohuslav (FZU-D) RID, ORCID
    Knápek, Petr (FZU-D)
    Stuchlík, Jiří (FZU-D) RID, ORCID
    Kočka, Jan (FZU-D) RID, ORCID, SAI
    Source Title Journal of Non-Crystalline Solids. 266-269, - (2000), s. 309-314. - : Elsevier
    Document TypeČlánek v odborném periodiku
    Grant IAA1010809 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
    GA202/98/0669 GA ČR - Czech Science Foundation (CSF)
    NEDO, XC
    CEZAV0Z1010914 - FZU-D
    Languageeng
    CountryNL
    Permanent Linkhttp://hdl.handle.net/11104/0030965
     

Number of the records: 1  

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