FEJFAR, A., REZEK, B., KNÁPEK, P., STUCHLÍK, J., KOČKA, J. Local electronic transport in microrystalline silicon observed by combined atomic force microscopy. Journal of Non-Crystalline Solids. 2000, 266-269(-), 309-314. ISSN 0022-3093. E-ISSN 1873-4812.