Deineka, Alexander - Tarasenko, A. A. - Jastrabík, Lubomír - Chvostová, Dagmar - Boušek, Jaroslav
An ellipsometric study of W thin films deposited on Si.
Thin Solid Films. Roč. 339, - (1999), s. 216-219. ISSN 0040-6090. E-ISSN 1879-2731
R&D Projects: GA AV ČR IAA2010536
Impact factor: 1.101, year: 1999
http://hdl.handle.net/11104/0030805