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An ellipsometric study of W thin films deposited on Si
- 1.DEINEKA, Alexander, TARASENKO, A. A., JASTRABÍK, Lubomír, CHVOSTOVÁ, Dagmar, BOUŠEK, Jaroslav. An ellipsometric study of W thin films deposited on Si. Thin Solid Films. 1999, 339(-), 216-219. ISSN 0040-6090. E-ISSN 1879-2731.
Number of the records: 1