Charge screening around Si dopant atoms in GaAs by X-STM

Number of the records: 1

SYSNO	0132494
Title	Charge screening around Si dopant atoms in GaAs by X-STM
Author(s)	Pacherová, Oliva (FZU-D)_{RID, ORCID} Slezák, Jiří (FZU-D) Cukr, Miroslav (FZU-D) Bartoš, Igor (FZU-D)_{RID, ORCID}
Source Title	Czechoslovak Journal of Physics. Roč. 49, č. 11 (1999), s. 4736C-4739C. - : Springer
Conference	Symposium on Surface Physics /7./, Třešť, 28.06.1999-02.07.1999
Document Type	Článek v odborném periodiku
Grant	GA102/99/0415 GA ČR - Czech Science Foundation (CSF)
	Kontakt-090, CZ - Czech Republic
CEZ	AV0Z1010914 - FZU-D
Language	eng
Country	CZ
Permanent Link	http://hdl.handle.net/11104/0000567

Number of the records: 1