Applicability of raman scattering for the characterization of nanocrystalline silicon

Number of the records: 1

SYSNO	0132467
Title	Applicability of raman scattering for the characterization of nanocrystalline silicon
Author(s)	Ossadnik, Ch. (DE) Vepřek, S. (DE) Gregora, Ivan (FZU-D)_{RID, ORCID}
Source Title	Thin Solid Films. Roč. 337, - (1999), s. 148-151. - : Elsevier
Document Type	Článek v odborném periodiku
CEZ	AV0Z1010914 - FZU-D
Language	eng
Country	NL
Permanent Link	http://hdl.handle.net/11104/0030490

Number of the records: 1