Number of the records: 1
Applicability of raman scattering for the characterization of nanocrystalline silicon
- 1.Ossadnik, Ch. - Vepřek, S. - Gregora, Ivan
Applicability of raman scattering for the characterization of nanocrystalline silicon.
Thin Solid Films. Roč. 337, - (1999), s. 148-151. ISSN 0040-6090. E-ISSN 1879-2731
Impact factor: 1.101, year: 1999
http://hdl.handle.net/11104/0030490
Number of the records: 1