Number of the records: 1  

Applicability of raman scattering for the characterization of nanocrystalline silicon

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    $a Applicability of raman scattering for the characterization of nanocrystalline silicon
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    $3 cav_un_auth*0100214 $a Gregora $b Ivan $p FZU-D $w Dielectrics $4 070 $T Fyzikální ústav AV ČR, v. v. i.

Number of the records: 1  

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