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Applicability of raman scattering for the characterization of nanocrystalline silicon
SYS 0132467 LBL 00000nam^^22^^^^^^^^450 005 20210803155013.7 101 0-
$a eng 102 $a NL 200 1-
$a Applicability of raman scattering for the characterization of nanocrystalline silicon 215 $a 4 s. 463 -1
$1 001 cav_un_epca*0257662 $1 011 $a 0040-6090 $e 1879-2731 $1 200 1 $a Thin Solid Films $v Roč. 337, - (1999), s. 148-151 $1 210 $c Elsevier 700 -1
$3 cav_un_auth*0063367 $a Ossadnik $b Ch. $y DE $4 070 701 -1
$3 cav_un_auth*0063368 $a Vepřek $b S. $y DE $4 070 701 -1
$3 cav_un_auth*0100214 $a Gregora $b Ivan $p FZU-D $w Dielectrics $4 070 $T Fyzikální ústav AV ČR, v. v. i.
Number of the records: 1