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Applicability of raman scattering for the characterization of nanocrystalline silicon
- 1.OSSADNIK, C., VEPŘEK, S., GREGORA, I. Applicability of raman scattering for the characterization of nanocrystalline silicon. Thin Solid Films. 1999, 337(-), 148-151. ISSN 0040-6090. E-ISSN 1879-2731.
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