Local characterization of electronic transport in microcrystalline silicon thin films with submicron resolution

Name: Local characterization of electronic transport in microcrystalline silicon thin films with submicron resolution
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Rezek, Bohuslav; Stuchlík, Jiří; Fejfar, Antonín; Kočka, Jan

Number of the records: 1

Local characterization of electronic transport in microcrystalline silicon thin films with submicron resolution

1.

SYSNO	0132433
Title	Local characterization of electronic transport in microcrystalline silicon thin films with submicron resolution
Author(s)	Rezek, Bohuslav (FZU-D)_{RID, ORCID} Stuchlík, Jiří (FZU-D)_{RID, ORCID} Fejfar, Antonín (FZU-D)_{RID, ORCID, SAI} Kočka, Jan (FZU-D)_{RID, ORCID, SAI}
Source Title	Applied Physics Letters. Roč. 74, - (1999), s. 1475-1477. - : AIP Publishing
Document Type	Článek v odborném periodiku
Grant	KSK1010601 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
CEZ	AV0Z1010914 - FZU-D
Language	eng
Country	US
Permanent Link	http://hdl.handle.net/11104/0030459

Number of the records: 1