0132392 - FZU-D 990340 RIV US eng J - Journal Article
Rezek, Bohuslav - Nebel, C. E. - Stutzmann, M.
Correlation of photoinductivity and structure of microcrystalline silicon thin films with submicron resolution.
Applied Physics Letters. Roč. 75, č. 12 (1999), s. 1742-1744. ISSN 0003-6951. E-ISSN 1077-3118
R&D Projects: GA ČR GA202/98/0669; GA AV ČR IAA1010809
Grant - others:BMBF(DE) BEC0329814
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 4.184, year: 1999
Permanent Link: http://hdl.handle.net/11104/0030419