Number of the records: 1
Escape probability of 0 1s photoelectrons leaving aluminium oxide
- 1.0132111 - FZU-D 980413 RIV GB eng C - Conference Paper (international conference)
Zemek, Josef - Hucek, Stanislav - Jablonski, A. - Tilinin, I. S.
Escape probability of 0 1s photoelectrons leaving aluminium oxide.
Proceedings of European Conference on Applied Surface and Interface Analysis- ECASIA 97. Chichester: John Wiley and Sons, Ltd., 1997 - (Olefjord, I.; Nyborg, L.; Briggs, D.), s. 840-843. 0 471 978 27 2.
[NTSA 97 - New Trends in Surface Analysis. Bratislava (SK), 26.11.1997-28.11.1997]
R&D Projects: GA ČR GA202/95/0032
Permanent Link: http://hdl.handle.net/11104/0030148
Number of the records: 1